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LBIST for Automotive ICs With Enhanced Test Generation

Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Lukasz Rybak 0001, Jerzy Tyszer. LBIST for Automotive ICs With Enhanced Test Generation. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(7):2290-2300, 2022. [doi]

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