Wisam Kadry, Dmitry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Jin-Sung Park, Sung-Boem Park, WooKyeong Jeong, Jae Cheol Son. Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms. IEEE Design & Test of Computers, 34(1):65-76, 2017. [doi]
Abstract is missing.