Design-aware mask inspection

Abde Ali Kagalwalla, Puneet Gupta, Chris Progler, Steve McDonald. Design-aware mask inspection. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 93-99, IEEE, 2010. [doi]

Authors

Abde Ali Kagalwalla

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Puneet Gupta

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Chris Progler

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Steve McDonald

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