Andrew B. Kahng, Ilgweon Kang. Co-optimization of memory BIST grouping, test scheduling, and logic placement. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{KahngK14, title = {Co-optimization of memory BIST grouping, test scheduling, and logic placement}, author = {Andrew B. Kahng and Ilgweon Kang}, year = {2014}, doi = {10.7873/DATE2014.209}, url = {http://dx.doi.org/10.7873/DATE2014.209}, researchr = {https://researchr.org/publication/KahngK14}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014}, publisher = {IEEE}, }