Co-optimization of memory BIST grouping, test scheduling, and logic placement

Andrew B. Kahng, Ilgweon Kang. Co-optimization of memory BIST grouping, test scheduling, and logic placement. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]

Abstract

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