Impact of Gate-Length Biasing on Threshold-Voltage Selection - researchr publication authors

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Andrew B. Kahng, Swamy Muddu, Puneet Sharma. Impact of Gate-Length Biasing on Threshold-Voltage Selection. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 747-754, IEEE Computer Society, 2006. [doi]

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