Andrew B. Kahng, Swamy Muddu, Puneet Sharma. Impact of Gate-Length Biasing on Threshold-Voltage Selection. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 747-754, IEEE Computer Society, 2006. [doi]
@inproceedings{KahngMS06,
title = {Impact of Gate-Length Biasing on Threshold-Voltage Selection},
author = {Andrew B. Kahng and Swamy Muddu and Puneet Sharma},
year = {2006},
doi = {10.1109/ISQED.2006.72},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.72},
researchr = {https://researchr.org/publication/KahngMS06},
cites = {0},
citedby = {0},
pages = {747-754},
booktitle = {7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2523-7},
}