A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances - researchr publication authors

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Andrew B. Kahng, Rasit Onur Topaloglu. A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 467-474, IEEE Computer Society, 2007. [doi]

This author has not been identified. Look up 'Andrew B. Kahng' in GoogleThis author has not been identified. Look up 'Rasit Onur Topaloglu' in Google

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