Andrew B. Kahng, Rasit Onur Topaloglu. A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 467-474, IEEE Computer Society, 2007. [doi]
@inproceedings{KahngT07,
title = {A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances},
author = {Andrew B. Kahng and Rasit Onur Topaloglu},
year = {2007},
doi = {10.1109/ISQED.2007.11},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.11},
tags = {rule-based},
researchr = {https://researchr.org/publication/KahngT07},
cites = {0},
citedby = {0},
pages = {467-474},
booktitle = {8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-2795-6},
}