Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty. On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. In 21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings. pages 387-396, IEEE Computer Society, 2003. [doi]
@inproceedings{KajiharaDLC03, title = {On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume}, author = {Seiji Kajihara and Yasumi Doi and Lei Li and Krishnendu Chakrabarty}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/iccd/2003/2025/00/20250387abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/KajiharaDLC03}, cites = {0}, citedby = {0}, pages = {387-396}, booktitle = {21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings}, publisher = {IEEE Computer Society}, isbn = {0-7695-2025-1}, }