Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty. On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. In 21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings. pages 387-396, IEEE Computer Society, 2003. [doi]
Abstract is missing.