Estimation of delay test quality and its application to test generation - researchr publication authors

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Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo. Estimation of delay test quality and its application to test generation. In Georges G. E. Gielen, editor, 2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA. pages 413-417, IEEE, 2007. [doi]

This author has not been identified. Look up 'Seiji Kajihara' in GoogleThis author has not been identified. Look up 'Shohei Morishima' in GoogleThis author has not been identified. Look up 'Masahiro Yamamoto' in GoogleThis author has not been identified. Look up 'Xiaoqing Wen' in GoogleThis author has not been identified. Look up 'Masayasu Fukunaga' in GoogleThis author has not been identified. Look up 'Kazumi Hatayama' in GoogleThis author has not been identified. Look up 'Takashi Aikyo' in Google

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