Estimation of delay test quality and its application to test generation

Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo. Estimation of delay test quality and its application to test generation. In Georges G. E. Gielen, editor, 2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA. pages 413-417, IEEE, 2007. [doi]

Abstract

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