Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo. Estimation of Delay Test Quality and Its Application to Test Generation. IPSJ T. on System LSI Design Methodology, 1:104-115, 2008. [doi]
@article{KajiharaMYWFHA08,
title = {Estimation of Delay Test Quality and Its Application to Test Generation},
author = {Seiji Kajihara and Shohei Morishima and Masahiro Yamamoto and Xiaoqing Wen and Masayasu Fukunaga and Kazumi Hatayama and Takashi Aikyo},
year = {2008},
doi = {10.2197/ipsjtsldm.1.104},
url = {http://dx.doi.org/10.2197/ipsjtsldm.1.104},
researchr = {https://researchr.org/publication/KajiharaMYWFHA08},
cites = {0},
citedby = {0},
journal = {IPSJ T. on System LSI Design Methodology},
volume = {1},
pages = {104-115},
}