Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo. Estimation of Delay Test Quality and Its Application to Test Generation. IPSJ T. on System LSI Design Methodology, 1:104-115, 2008. [doi]
Abstract is missing.