Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits

Seiji Kajihara, Irith Pomeranz, Kozo Kinoshita, Sudhakar M. Reddy. Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits. In DAC. pages 102-106, 1993. [doi]

Abstract

Abstract is missing.