Test generation for multiple faults based on parallel vector pair analysis - researchr publication related

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Seiji Kajihara, Tetsuji Sumioka, Kozo Kinoshita. Test generation for multiple faults based on parallel vector pair analysis. In Michael R. Lightner, Jochen A. G. Jess, editors, Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993. pages 436-439, IEEE Computer Society, 1993. [doi]

The following publications are possibly variants of this publication:

Acceleration Techniques of Multiple Fault Test Generation Using Vector Pair AnalysisSeiji Kajihara, Rikiya Nishigaya, Tetsuji Sumioka, Kozo Kinoshita. ieicet, 78-D(7):811-816, 1995. [doi]

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