Seiji Kajihara, Tetsuji Sumioka, Kozo Kinoshita. Test generation for multiple faults based on parallel vector pair analysis. In Michael R. Lightner, Jochen A. G. Jess, editors, Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993. pages 436-439, IEEE Computer Society, 1993. [doi]
Abstract is missing.