Test Data Compression Using Don?t-Care Identification and Statistical Encoding - researchr publication authors

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Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy. Test Data Compression Using Don?t-Care Identification and Statistical Encoding. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 67, IEEE Computer Society, 2002. [doi]

This author has not been identified. Look up 'Seiji Kajihara' in GoogleThis author has not been identified. Look up 'Kenjiro Taniguchi' in GoogleThis author has not been identified. Look up 'Kohei Miyase' in GoogleThis author has not been identified. Look up 'Irith Pomeranz' in GoogleThis author has not been identified. Look up 'Sudhakar M. Reddy' in Google

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