IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs

Srisubha Kalanadhabhatta, Rashi Dutt, S. Saqib Khursheed, Amit Acharyya. IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs. In IEEE International Symposium on Circuits and Systems, ISCAS 2021, Daegu, South Korea, May 22-28, 2021. pages 1-5, IEEE, 2021. [doi]

Authors

Srisubha Kalanadhabhatta

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Rashi Dutt

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S. Saqib Khursheed

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Amit Acharyya

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