Srisubha Kalanadhabhatta, Rashi Dutt, S. Saqib Khursheed, Amit Acharyya. IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs. In IEEE International Symposium on Circuits and Systems, ISCAS 2021, Daegu, South Korea, May 22-28, 2021. pages 1-5, IEEE, 2021. [doi]
@inproceedings{Kalanadhabhatta21,
title = {IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs},
author = {Srisubha Kalanadhabhatta and Rashi Dutt and S. Saqib Khursheed and Amit Acharyya},
year = {2021},
doi = {10.1109/ISCAS51556.2021.9401363},
url = {https://doi.org/10.1109/ISCAS51556.2021.9401363},
researchr = {https://researchr.org/publication/Kalanadhabhatta21},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2021, Daegu, South Korea, May 22-28, 2021},
publisher = {IEEE},
isbn = {978-1-7281-9201-7},
}