Manolis Kaliorakis, Sotiris Tselonis, Athanasios Chatzidimitriou, Dimitris Gizopoulos. Accelerated microarchitectural Fault Injection-based reliability assessment. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. pages 47-52, IEEE, 2015. [doi]
@inproceedings{KaliorakisTCG15,
title = {Accelerated microarchitectural Fault Injection-based reliability assessment},
author = {Manolis Kaliorakis and Sotiris Tselonis and Athanasios Chatzidimitriou and Dimitris Gizopoulos},
year = {2015},
doi = {10.1109/DFT.2015.7315134},
url = {http://dx.doi.org/10.1109/DFT.2015.7315134},
researchr = {https://researchr.org/publication/KaliorakisTCG15},
cites = {0},
citedby = {0},
pages = {47-52},
booktitle = {2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8606-4},
}