Manolis Kaliorakis, Sotiris Tselonis, Athanasios Chatzidimitriou, Dimitris Gizopoulos. Accelerated microarchitectural Fault Injection-based reliability assessment. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. pages 47-52, IEEE, 2015. [doi]
No references recorded for this publication.
No citations of this publication recorded.