Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos. Efficient Multiphase Test Set Embedding for Scan-based Testing. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 433-438, IEEE Computer Society, 2006. [doi]
Abstract is missing.