An area effective forward/reverse body bias generator for within-die variability compensation

Norihiro Kamae, Akira Tsuchiya, Hidetoshi Onodera. An area effective forward/reverse body bias generator for within-die variability compensation. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2011, Jeju, South Korea, November 14-16, 2011. pages 217-220, IEEE, 2011. [doi]

Abstract

Abstract is missing.