Mehdi Kamal, Qing Xie, Massoud Pedram, Ali Afzali-Kusha, Saeed Safari. An efficient reliability simulation flow for evaluating the hot carrier injection effect in CMOS VLSI circuits. In 30th International IEEE Conference on Computer Design, ICCD 2012, Montreal, QC, Canada, September 30 - Oct. 3, 2012. pages 352-357, IEEE Computer Society, 2012. [doi]
Abstract is missing.