Dina Kamel, Cédric Hocquet, François-Xavier Standaert, Denis Flandre, David Bol. Glitch-induced within-die variations of dynamic energy in voltage-scaled nano-CMOS circuits. In 36th European Solid-State Circuits Conference, ESSCIRC 2010, Sevilla, Spain, September 13-17, 2010. pages 518-521, IEEE, 2010. [doi]
Abstract is missing.