Shuichi Kameyama, Hideyuki Ohara, Chihiro Endo, Naoki Takayama. Interconnect and Delay Testing with a 4800-Pin Board Tester. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 338-344, IEEE Computer Society, 1992.
Abstract is missing.