Naotake Kamiura, Teijiro Isokawa, Nobuyuki Matsui. PODEM Based on Static Testability Measures and Dynamic Testability Measures for Multiple-Valued Logic Circuits. In 32nd IEEE International Symposium on Multiple-Valued Logic (ISMVL 2002), May 15-18, 2002, Boston, Massachusetts, USA. pages 149-155, IEEE Computer Society, 2002. [doi]
Abstract is missing.