Simon Kamm, Sandra Bickelhaupt, Kanuj Sharma, Nasser Jazdi, Ingmar Kallfass, Michael Weyrich. Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors. In 27th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2022, Stuttgart, Germany, September 6-9, 2022. pages 1-8, IEEE, 2022. [doi]
Abstract is missing.