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Design of a Practical Nanometer-Scale Redundant Via-Aware Standard Cell Library for Improved Redundant Via1 Insertion Rate

Tsang-Chi Kan, Shih Hsien Yang, Ting-Feng Chang, Shanq-Jang Ruan. Design of a Practical Nanometer-Scale Redundant Via-Aware Standard Cell Library for Improved Redundant Via1 Insertion Rate. IEEE Trans. VLSI Syst., 21(1):142-147, 2013. [doi]

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