Design impact of positive temperature dependence on drain current in sub-1-V CMOS VLSIs

Kouichi Kanda, Kouichi Nose, Hiroshi Kawaguchi, Takayasu Sakurai. Design impact of positive temperature dependence on drain current in sub-1-V CMOS VLSIs. J. Solid-State Circuits, 36(10):1559-1564, 2001. [doi]

Abstract

Abstract is missing.