Kouichi Kanda, Kouichi Nose, Hiroshi Kawaguchi, Takayasu Sakurai. Design impact of positive temperature dependence of drain current in sub 1 V CMOS VLSIs. In Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, CICC 1999, San Diego, CA, USA, May 1649,1999. pages 563-566, IEEE, 1999. [doi]
@inproceedings{KandaNKS99,
title = {Design impact of positive temperature dependence of drain current in sub 1 V CMOS VLSIs},
author = {Kouichi Kanda and Kouichi Nose and Hiroshi Kawaguchi and Takayasu Sakurai},
year = {1999},
doi = {10.1109/CICC.1999.777344},
url = {https://doi.org/10.1109/CICC.1999.777344},
researchr = {https://researchr.org/publication/KandaNKS99},
cites = {0},
citedby = {0},
pages = {563-566},
booktitle = {Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, CICC 1999, San Diego, CA, USA, May 1649,1999},
publisher = {IEEE},
isbn = {0-7803-5443-5},
}