Kouichi Kanda, Kouichi Nose, Hiroshi Kawaguchi, Takayasu Sakurai. Design impact of positive temperature dependence of drain current in sub 1 V CMOS VLSIs. In Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, CICC 1999, San Diego, CA, USA, May 1649,1999. pages 563-566, IEEE, 1999. [doi]
Abstract is missing.