Time-Constrained Failure Diagnosis in Distributed Embedded Systems

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray. Time-Constrained Failure Diagnosis in Distributed Embedded Systems. In 2002 International Conference on Dependable Systems and Networks (DSN 2002), 23-26 June 2002, Bethesda, MD, USA, Proceedings. pages 449-458, IEEE Computer Society, 2002. [doi]

Abstract

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