Mineo Kaneko, Jian Li. Post-silicon skew tuning algorithm utilizing setup and hold timing tests. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 125-128, IEEE, 2012. [doi]
@inproceedings{KanekoL12,
title = {Post-silicon skew tuning algorithm utilizing setup and hold timing tests},
author = {Mineo Kaneko and Jian Li},
year = {2012},
doi = {10.1109/ISCAS.2012.6271463},
url = {http://dx.doi.org/10.1109/ISCAS.2012.6271463},
researchr = {https://researchr.org/publication/KanekoL12},
cites = {0},
citedby = {0},
pages = {125-128},
booktitle = {2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0218-0},
}