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Mineo Kaneko, Jian Li. Post-silicon skew tuning algorithm utilizing setup and hold timing tests. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 125-128, IEEE, 2012. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Margin aware timing test and tuning algorithm for post-silicon skew tuningMineo Kaneko. mwscas 2017: 1244-1247 [doi] Timing-test scheduling for constraint-graph based post-silicon skew tuningMineo Kaneko. iccd 2012: 460-465 [doi] Scheduling of PDE setting and timing tests for post-silicon skew tuning with timing margin: [extended abstract]Mineo Kaneko. glvlsi 2014: 91-92 [doi]
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