Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy. NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 726-731, IEEE, 2008. [doi]
Abstract is missing.