On Minimizing Analog Variation Errors to Resolve the Scalability Issue of ReRAM-Based Crossbar Accelerators

Yao-Wen Kang, Chun-Feng Wu, Yuan-Hao Chang, Tei-Wei Kuo, Shu-Yin Ho. On Minimizing Analog Variation Errors to Resolve the Scalability Issue of ReRAM-Based Crossbar Accelerators. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(11):3856-3867, 2020. [doi]

Authors

Yao-Wen Kang

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Chun-Feng Wu

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Yuan-Hao Chang

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Tei-Wei Kuo

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Shu-Yin Ho

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