On Minimizing Analog Variation Errors to Resolve the Scalability Issue of ReRAM-Based Crossbar Accelerators

Yao-Wen Kang, Chun-Feng Wu, Yuan-Hao Chang, Tei-Wei Kuo, Shu-Yin Ho. On Minimizing Analog Variation Errors to Resolve the Scalability Issue of ReRAM-Based Crossbar Accelerators. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(11):3856-3867, 2020. [doi]

@article{KangWCKH20,
  title = {On Minimizing Analog Variation Errors to Resolve the Scalability Issue of ReRAM-Based Crossbar Accelerators},
  author = {Yao-Wen Kang and Chun-Feng Wu and Yuan-Hao Chang and Tei-Wei Kuo and Shu-Yin Ho},
  year = {2020},
  doi = {10.1109/TCAD.2020.3012250},
  url = {https://doi.org/10.1109/TCAD.2020.3012250},
  researchr = {https://researchr.org/publication/KangWCKH20},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {39},
  number = {11},
  pages = {3856-3867},
}