Noise characterization of static CMOS gates - researchr publication authors

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Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum. Noise characterization of static CMOS gates. In Sharad Malik, Limor Fix, Andrew B. Kahng, editors, Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004. pages 888-893, ACM, 2004. [doi]

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