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Sachhidh Kannan, Naghmeh Karimi, Ramesh Karri, Ozgur Sinanoglu. Detection, diagnosis, and repair of faults in memristor-based memories. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]