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Physics-Based Low-Cost Test Technique for High Voltage LDMOS

Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi. Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electronic Testing, 29(6):745-762, 2013. [doi]

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Sukeshwar Kannan

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Kaushal Kannan

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Bruce C. Kim

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Friedrich Taenzler

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Richard Antley

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Ken Moushegian

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Kenneth M. Butler

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Doug Mirizzi

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