Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi. Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electronic Testing, 29(6):745-762, 2013. [doi]
@article{KannanKKTAMBM13,
title = {Physics-Based Low-Cost Test Technique for High Voltage LDMOS},
author = {Sukeshwar Kannan and Kaushal Kannan and Bruce C. Kim and Friedrich Taenzler and Richard Antley and Ken Moushegian and Kenneth M. Butler and Doug Mirizzi},
year = {2013},
doi = {10.1007/s10836-013-5417-5},
url = {http://dx.doi.org/10.1007/s10836-013-5417-5},
researchr = {https://researchr.org/publication/KannanKKTAMBM13},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {29},
number = {6},
pages = {745-762},
}