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All Tests for a Fault Are Not Equally Valuable for Defect Detection

Rohit Kapur, Jaehong Park, M. Ray Mercer. All Tests for a Fault Are Not Equally Valuable for Defect Detection. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 762-769, IEEE Computer Society, 1992.

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