T. A. Karatsori, K. Bennamane, Christoforos G. Theodorou, L. Czornomaz, Jean Fompeyrine, C. B. Zota, C. Convcrtino, G. Ghibaudo. Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator. In 48th European Solid-State Device Research Conference, ESSDERC 2018, Dresden, Germany, September 3-6, 2018. pages 166-169, IEEE, 2018. [doi]
Abstract is missing.