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Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies

Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell. Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies. In 19th IEEE Latin-American Test Symposium, LATS 2018, Sao Paulo, Brazil, March 12-14, 2018. pages 1-5, IEEE, 2018. [doi]

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Amit Karel

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Florence Azaïs

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Mariane Comte

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Jean Marc Gallière

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Michel Renovell

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