Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell. Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies. In 19th IEEE Latin-American Test Symposium, LATS 2018, Sao Paulo, Brazil, March 12-14, 2018. pages 1-5, IEEE, 2018. [doi]
@inproceedings{KarelACGR18,
title = {Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies},
author = {Amit Karel and Florence Azaïs and Mariane Comte and Jean Marc Gallière and Michel Renovell},
year = {2018},
doi = {10.1109/LATW.2018.8349696},
url = {https://doi.org/10.1109/LATW.2018.8349696},
researchr = {https://researchr.org/publication/KarelACGR18},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {19th IEEE Latin-American Test Symposium, LATS 2018, Sao Paulo, Brazil, March 12-14, 2018},
publisher = {IEEE},
isbn = {978-1-5386-1472-3},
}