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Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies

Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell. Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies. J. Electronic Testing, 35(1):59-75, 2019. [doi]

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