Accelerated On-chip Communication Test Methodology Using a Novel High-Level Fault Model - researchr publication authors

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Elmira Karimi, Mohammad Hashem Haghbayan, Amir-Mohammad Rahmani, Mahmoud Tabandeh, Pasi Liljeberg, Zainalabedin Navabi. Accelerated On-chip Communication Test Methodology Using a Novel High-Level Fault Model. In IEEE 9th International Symposium on Embedded Multicore/Many-core Systems-on-Chip, MCSoC 2015, Turin, Italy, September 23-25, 2015. pages 283-288, IEEE, 2015. [doi]

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Amir-Mohammad Rahmani

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